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page 56 IV curve characterisation systemSolar simulators and probe stations are combined with high quality measurement instruments and the ReRa Tracer software. This has resulted in a complete IV curve measurement system.FeaturesComplete solar cell IV-curve tracing and analysisIEC standards compliantReference cell corrected metrologyWide range of solar simulators and Source-Meters controlledFreely downloadable extension plug-ins add new instruments controlled and analysis techniquesDark curve and temperature dependence analysisDatabase connectors for SQL server and MySQLNumerous solar cell material speci!c models includedReRa Tracer Software????????IEC standards compliant????????Reference cell corrected metrology????????Correction to standard test conditions????????Wide range of solar simulators and Source-Meters controlled????????Dark curve and temperature dependence analysis????????Database connectors for SQL server and MySQL????????Numerous solar cell material speci!c models includedTest Stations????????Standard current ranges to 5A (10 A on special order)????????1x1 mm to 156x156 mm stations standard????????Pneumatic actuated stations for the manufacturing "oor????????Temperature controlled and vacuum chuck stations????????Probes spaced so as to equalize current density within the$solar cell????????Low shadowing, spring loaded probes????????Kelvin probe (four point measurements) methodology$standardIV Curve Measurement

Spectroscopy49SPEQUEST: Quantum Ef!ciency and Spectral Response Characterisation"of Solar CellsIn today's rapidly evolving markets for solar cells, the characterization of the spectral response (quantum ef!ciency) is one of the most important parameters for research and development of new materials and devices but also for production and quality control.Today still 90% of the solar cells manufactured around the world are single junction silicon devices; therefore the layout of a spectral response measurement system is relatively simple and straightforward. However, the most promising research areas focus on different devices and materials, e.g. thin !lm and 3rd generation devices, which require a different layout of a spectral response characterization system.SPEQUEST takes into account the latest developments in solar cell research, the modular and very "exible setup enables quick and simple adaptation to research and production requirements. PHOTOR software allows complete control of the measurement and data evaluation, all calculations are IEC compliant.FeaturesComplete turnkey solution for spectral characterizationModular setup for maximum "exibilityAll types of solar cells:????????polysilicon, c-Si, mc-Si, nc-Si????????III/V compound cells????????thin !lm: CdTe, CIS, CIGS, Si????????3rd generation: organic polymer, dyeSingle and multi-junction devicesSpectral range 250 - 1800 nmVariable white bias lightMulticolour bias lightDC mode option includedMonochromatorLock InI/V ConverterSolar cellReference cellBias lightPHOTORComputer ControlQTH100 WFilter WheelFiberChopperSystem architecture