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page 56 Resolution Optical and Scanning Probe MicrosopesA Modular Product Line - Flexibility for almost any microscopy application you may encounterThe WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system con!gurations for the highest "exibility throughout a wide range of microscopy applications. alpha300 R alpha300 A alpha300 S alpha500 alpha700 Raman AFM SNOM Raman/AFM Raman/AFM????????Raman Microscopy????????Scanning Near-!eld optical Microscopy (SNOM or NSOM)????????Atomic Force Microscopy (AFM)????????Confocal MicroscopyFocusing on innovations and constantly introducing new technologies, we are the leading experts for your optical, structural and chemical imaging tasks.Confocal Raman Microscope Alpha300 RA New Dimension in Raman Microscopy: Ultra-fast & high resolution chemical"imaging The confocal Raman imaging system alpha300 R offers the unique ability to acquire chemical information non-destructively with a resolution down to the optical diffraction limit (~ 200 nm). This allows you to observe and analyze the distribution of different phases within a sample in ambient conditions without specialized sample preparation. Because of the confocal setup, it is not only possible to collect information from the sample surface, but also to look deep inside transparent samples and even obtain 3D information. A complete Raman spectrum is acquired at each image pixel, resulting in images consisting of tens of thousands of spectra. The acquisition time for one spectrum is only in the range of milliseconds, resulting in complete images being collected in a matter of minutes. When analyzing dedicated peak characteristics of the spectra, a variety of images can be generated using only a single set of data. This allows you not only to image the distribution of chemical compounds, but also to analyze, for example crystallinity or material stress properties. Further applications are typically found in polymer science, coating and thin !lm analysis, geoscience and in the pharmaceutical$industry.Alpha300R options????????Ultrafast Raman Imaging Option????????AFM Upgrade for the Confocal Raman Microscope alpha300R????????SNOM upgrade for the Confocal Raman Microscope alpha300 RAlpha 300 R

Nanotechnology37Atomic Force Microscope Alpha300 AHigh-Performance User-Friendly AFM for Materials Research, Life Sciences and NanotechnologyThe alpha300 A integrates an AFM system with a scienti!c grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can bene!t an enormous variety of scienti!c endeavors.The WITec AFM-Objective allows high resolution and simultaneous sample and cantilever view from the$top.All standard AFM modes are supported, assuring the highest "exibility throughout the full range of AFM applications. Whether you work in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution.Scanning Near-!eld Optical Microscope Alpha300 SReliable and Sophisticated SNOM Imaging - Beyond the Diffraction LimitThe design of the alpha300 S Scanning Near-!eld Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.For scanning near-!eld optical microscopy, the alpha300 S uses unique and patented micro-fabricated Cantilever SNOM-sensors that signi!cantly outperform standard !ber optic probes in resolution, transmission, ease of operation and reliability.The cantilever, employing the well established beam de"ection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.Typical applications for SNOM are found in materials science, life science, and nanophotonics or nanotechnology.Raman Imaging Upgrade for the Scanning Near-!eld optical Microscope alpha300 SThe Confocal Raman Imaging Upgrade option for the WITec alpha300 S Scanning Near-!eld Optical Microscope allows the acquisition of Raman images from chemical investigations to be linked to the AFM topographic information from the same sample area. No transferring or touching of the sample is required as the two modes are easily accessible by just rotating the microscope turret. Even simultaneous AFM-Raman data acquisition is possible.Alpha 300 AAlpha 300 S