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Materials Analysis33IBIS Nanoindentation TesterIBIS is a precision nanoindentation tester offering traceable calibration, robust design, closed loop operation, solid theoretical base, and unmatched accuracy, reliability and price. IBIS Nanoindentation Tester is compatible with ISO14577 and a range of models are available to suit all budgets.All IBIS Models come with motorized z axis for automatic"approach:????????Simplus includes a stepper motor driven X stage for unattended operation????????Advantage has XY stepper motor stages and single-lens microscope????????Authority has high resolution DC motor XY stages and 4-turret microscope.All IBIS Models can be !tted with a choice of low load or high load head units. Key FeaturesAutomatic z approachUnattended operationPrecision PZT actuator3 year warrantyReal time force (and displacement) feedbackCompact design, clear span for large samplesClosed loop XY positioning (Advantage$model)Easy indenter changeover (no messy clamps, special tools or service calls)Robust LVDT design can withstand signi!cant$abuseDedicated force sensor separate from load$actuatorOperating Modes????????Nanoindentation????????Partial unload technique????????Multiple-frequency dynamic testing with Fourier$analysis????????Tension/Compression????????Creep Scratch????????Batch (unattended) operationSpeci!cationsHeadModel A - Low LoadModel B - Mid RangeModel C - High LoadLoad range (dual range)0 - 10 mN & 0 - 100 mN0 - 50 mN & 0 - 500 mN0 - 200 mN & 0 - 2 N (5 N max optic)Digital resolution0.015 ?N0.05 ?N3 ?NNoise "oor<0.5 ?N<1 ?N<10 ?NMinimum contact load3 ?N5 ?N0.1 mNDepth Range0 - 1 ?m &0 - 2 ?m &0 - 20 ?m & 0 - 200 ?m(dual range)0 - 10 ?m0 - 20 ?m(500 ?m max option)Digital resolution0.0015 nm0.003 nm0.03 nmNoise "oor0.025 nm0.05 nm5 nmNanoindentation Force MicroscopyThe New NX10 - The World's Most Accurate AFMData accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. The NX10, the world's most accurate AFM, is the "agship AFM of Park Systems' new product line. The NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. The NX10 is the world's premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. As Park Systems' most user-friendly AFM, the NX10 makes AFM convenient and intuitive for new and experienced users alike.The XY scanner consisting of symmetrical 2-dimensional "exure and high-force piezoelectric stacks provides high orthogonal movement of minimal out-of-plane motion as well as high responsiveness essential for precise sample scanning in the nanometer scale. An XY scanner with optional scan size is available and has up to 100 ?m wide scan range.????????Flexure Guided XY Scanner????????Minimal Thermal Drift????????High Speed Z Scanner????????High Power Motorised Optics????????Low Noise Position Sensors????????Pre-aligned Tip Holder????????Fast Tip Approach????????SLD Head????????Motorised XY Sample Stage????????Auto Head Engage????????Mapping Automation????????Low Noise Floor????????Optical Access to CantileverKey Features of the NX10Sample Topography Measured by Low Noise Z DetectorZ detector noice is low enough to replace the applied voltage to the Z scanner as the Topography signal. The Z detector signal provides correct scanner positions during high speed scans, resulting in True Sample TopographyTM free of piezo creep.Industry Leading, Fast Z-Servo SpeedZ-scanner bandwidth of more than 9 kHz, or Z-servo speed of more than 62 mm/sec tip velocityOptimized Z servo speed with minimal Z scan mass (PSPD and tip)Keeps the probe within the narrow range of the attractive forceFast DSP servo control without time delayIndustry Leading, Z Scan LinearityIn Park Systems' Crosstalk Elimincation, the "exure-guided Z scanner is decoupled from the X and Y scan motion. Hence, the Z scan motion can be kept in a precise straight line. The Z scan linearity of the "exure guided scanner is less than 0.015%, enabling an accurate and precise angle measurement in the nanoscale.